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www.honeywellprocess.com/library/marketing/whitepapers/XCEEDCirrusEISatGulfStatesPaperCorporation1.pdf
Document Type: Whitepaper |  Date Authored: 7 Sep 2011 |  Size: 372KB
XCEED Cirrus EIS at Gulf States Paper Corporation1
www.honeywellprocess.com/library/marketing/whitepapers/FertilizerSolutions_White_Paper_WP0809ENG.pdf
Document Type: Whitepaper |  Date Authored: 7 Sep 2011 |  Size: 2MB
Fertilizer Solutions WhitePaper WP0809ENG
www.honeywellprocess.com/library/marketing/whitepapers/HoneywellEnergy_WhitePaper.pdf
Document Type: Whitepaper |  Date Authored: 7 Sep 2011 |  Size: 2MB
Honeywell and Energy Efficiency: Strategy Before Solutions
www.honeywellprocess.com/library/marketing/whitepapers/WPLuminant.pdf
Document Type: Whitepaper |  Date Authored: 7 Sep 2011 |  Size: 178KB
WP Luminant
www.honeywellprocess.com/library/marketing/whitepapers/IntegratedSafetyWhitePaper.1.pdf
Document Type: Whitepaper |  Date Authored: 7 Sep 2011 |  Size: 436KB
An Integrated Approach to Safety: Defense in Depth
www.honeywellprocess.com/library/marketing/whitepapers/494_HON_AdvSol_CPM_MillWideProcessControlPerformanceMonitoring_25Aug11_WP.pdf
Document Type: Whitepaper |  Date Authored: 23 Aug 2011 |  Size: 1MB
In many mills, the ratio of control assets to engineers is greater than 300 to 1, which often means a complaint-driven or failure-based maintenance model is the norm. Due to this work overload, many control issues are seen as tuning related and are often addressed in this manor or overlooked completely.
www.honeywellprocess.com/library/marketing/whitepapers/Industrializing Data Centers to Reach PUE Benchmark 1.2.pdf
Document Type: Whitepaper |  Date Authored: 23 Feb 2011 |  Size: 115KB
Honeywell has helped many data centers achieve the optimum Power Usage Effectiveness (PUE) ratio by improving their current control design with industrialized high accuracy instruments and controls that can dynamically monitor hotspots throughout the facility.
www.honeywellprocess.com/library/marketing/whitepapers/Integrated-Safety-WhitePaper.pdf
Document Type: Whitepaper |  Date Authored: 25 Nov 2010 |  Size: 436KB
Whitepaper on An Integrated Approach to Safety: Defense in Depth
www.honeywellprocess.com/library/marketing/whitepapers/Honeywell-Integrated-Overfill-Protection-WP-Apr2010.pdf
Document Type: Whitepaper |  Date Authored: 8 Jun 2010 |  Size: 1MB
White paper on Honeywell Integrated Overfill Protection.
www.honeywellprocess.com/library/marketing/whitepapers/WhitePaper_OpenDeviceIntegration_Nov08.pdf
Document Type: Whitepaper |  Date Authored: 10 Nov 2008 |  Size: 82KB
White Paper discusses how EDDL and FDT-DTM provide the ability to have a truly open integration of systems and devices in a multi-vendor environment.
41-50 of 52 results

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